Overview Academic/Research Interest Areas

Dimensional Metrology, Scanned Probe Microscopies

Coordinate Measuring Machines

Machine Tools and Machine Tool Metrology

Recent Publications

"Magnetically-suspended Stage for Accurate Positioning of Large Samples in Scanned Probe Microscopy", Proceedings of the MAG '98 Industrial Conference and Exhibition on Magnetic Bearings, Volume XXV, pp. 353-358, 1997.

"Sampling Methods and Substitute Geometry Algorithms for Measuring Cylinders in a Coordinate Measuring Machine", Transactions of NAMRI/SME, pp. 23-32, 1998.

"Thermal Imaging with Near-field Microscopy", Rev. Sci. Instruments, Vol.68, pp. 3096-3098, 1997.

"Frontiers in Precision Manufacturing - Metrology", International Journal for Manufacturing Science and Production, 1997.

"Self-calibration: Reversal, Redunancy, Error Separation and Absolute Testing", Annals of the CIRP, 45, 3, 1996.

What he/she brings to the industry

US Patent no. 4,714,339, "Three and Five Axis Tracking Systems", Dec. 1987

US Patent no. 6,434,845, Dual-axis Static and Dynamic Force Characterization Device

"Laser Polarimetric Roll Detector", submitted, March, 1993

"Stabilized Diode Laser", submitted 1995

"Fiber Optic White Light Interferometer", submitted 1997

"Miniature CMM probes", submitted 2005

"Laser system for large-scale metrology", submitted 2005

Research Grants

Laser Interferometry Timken (Equip. Donation) 30,000

Two Sphere Spindle Analyzer Professional Instruments (Equip. Donation) 5,000

Hewlett-Packard Laser Measurement System for Precision Engineering HP (Equip. Donation) 58,154

Star Linear Systems Metrology Equipment SLS (Equip. Donation) 5,750

Renishaw Inc. Machine Checking Gage Renishaw (Equip. Donation) 2,300

Crotts & Saunders Fosdick Jig Borer and Surface Plate Crotts & Sanders (Equip. Donation) 19,000

Coordinate Measuring Machine System Brown & Sharpe (Equip. Donation) 15,974

Laser Measurement System Renishaw (Equip. Donation) 58,154

Automatic Inspection Systems NCMS 63,373

Enhance the Development of Performance of CMMs NSF 21,612

Precision Engineering Guidelines NCMS 28,621

Dimensional Inspection Techniques CAM-I 128,674

Educational Background

B.A. Physics, Oregon State University, 1968

M.A. Physics, State University of New York at Stony Brook, 1969

Ph.D. Physics, State University of New York at Stony Brook, 1973

NBS-NRC Postdoctoral Fellow, 1973-75