Charlotte Research Institute
UNCC - Charlotte Research Institute
9201 University City Blvd
Charlotte, NC 28223
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Patrick Moyer

Patrick Moyer
Professor, Nanotechnology Metrology Instrumentation
Precision Metrology
324 Grigg Hall, UNC Charlotte
Phone: 704-687-8148
Email: pjmoyer@uncc.edu
Website: view website

Overview Academic/Research Interest Areas

Single molecule microscopy and spectroscopy

Nanoscale plasmon optics

Optical spectroscopy of nanoscale systems

Near-field Scanning Optical Microscopy (NSOM)

Recent Publications

Je Hong Kim and Patrick J. Moyer, "Transmission characteristics of metallic equilateral triangular nanohole arrays", Virtual Journal of Nanoscale Science and Technology 14, Issue 14, October 2, 2006.

Je Hong Kim and Patrick J. Moyer, "Transmission characteristics of metallic equilateral triangular nanohole arrays", Appl. Phys. Lett. 89, 121106 (2006).

Je Hong Kim and Patrick J. Moyer, "Thickness effects on the optical transmission characteristics of small hole arrays on thin gold films", Optics Express 14, 6595-6603 (2006).

Je Hong Kim, Bruce W. Dudley, and Patrick J. Moyer, "Experimental demonstration of replicated multimode interferometer power splitter in Zr-doped sol-gel", J. Lightwave Technol. January (2006).

Patrick J. Moyer, Andy Pridmore, and Faramarz Farahi, "Multimode Interference (MMI) switch design with low manufacturing tolerance", Optical Engineering, 43, 178 (2004).

Educational Background

B.S., Physics, Moravian College, Bethlehem, PA, 1986

M.S., Physics, Saint Bonaventure University, Olean, NY, 1988

Ph.D., Physics, North Carolina State University, Raleigh, NC, 1993

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