Patrick Moyer
Patrick Moyer
Professor, Nanotechnology Metrology Instrumentation
324 Grigg Hall, UNC Charlotte
Overview Academic/Research Interest Areas
Single molecule microscopy and spectroscopy
Nanoscale plasmon optics
Optical spectroscopy of nanoscale systems
Near-field Scanning Optical Microscopy (NSOM)
Recent Publications
Je Hong Kim and Patrick J. Moyer, "Transmission characteristics of metallic equilateral triangular nanohole arrays", Virtual Journal of Nanoscale Science and Technology 14, Issue 14, October 2, 2006.
Je Hong Kim and Patrick J. Moyer, "Transmission characteristics of metallic equilateral triangular nanohole arrays", Appl. Phys. Lett. 89, 121106 (2006).
Je Hong Kim and Patrick J. Moyer, "Thickness effects on the optical transmission characteristics of small hole arrays on thin gold films", Optics Express 14, 6595-6603 (2006).
Je Hong Kim, Bruce W. Dudley, and Patrick J. Moyer, "Experimental demonstration of replicated multimode interferometer power splitter in Zr-doped sol-gel", J. Lightwave Technol. January (2006).
Patrick J. Moyer, Andy Pridmore, and Faramarz Farahi, "Multimode Interference (MMI) switch design with low manufacturing tolerance", Optical Engineering, 43, 178 (2004).
Educational Background
B.S., Physics, Moravian College, Bethlehem, PA, 1986
M.S., Physics, Saint Bonaventure University, Olean, NY, 1988
Ph.D., Physics, North Carolina State University, Raleigh, NC, 1993




